|Place of Origin:||CHINA|
|Delivery Time:||40 DYAYS|
|Supply Ability:||100 set PER YEAR|
|Minimum Order Quantity:||1 SET|
Near field measurement,
antenna test system,
Using the planar near field method to measure antenna to get the antenna performance parameters from the test results; antenna far field radiation characteristics can be obtained, and diagnosis and analysis of antennas are made.
Near field measurement (as shown in Fig. 7.1): Using two test ports of the vector network analyzer as the near field test input and output ports; under the control of the main control computer, the output port, under the control of the driving device, through the test probe on the scanning frame, transmits signals under a certain scanning mode (single line, bi-directional, stepping); meanwhile, the other port of the test instrument acquires the test data through the antenna array, and transmits the data to the main control computer; the data processing system makes analysis and diagnosis of the near field characteristics of the antenna array, and makes the far field parameter calculation.
a) Scanning frame and probe positioning subsystem
Including the horizontal base (x), vertical tower frame (y), probe box (z);
b) Antenna mounting frame
Antenna mounting frame is used for installing the 14008 antenna; the central height coincides with the vertical center of the scanning frame; which can realize azimuth, pitching, polarization, forward and backward manual adjustment.
c) Radio frequency subsystem
Including the testing instruments, RF cable, probe, and so on
d) Control computer subsystem
It is the computer hardware used to test the system’s man-machine interface;
e) Scanning frame and probe positioning control software subsystem
It is a software package to control the scanning frame to move according to the anticipated way;
f) System main control and test data acquisition software subsystem
It is a software package used to test the system’s man-machine interface, including various control functions and data acquisition functions.
g) Test data multifunction processing software subsystem
Contact Person: Mr. Sundy